타이틀 |
Measurement of high temperature emissivity using the moving specimen method |
저자 |
Masaaki SANO, Kiyomichi ISHIDA, Kazuyuki MIHO, Osamu HAMAMURA, Satoshi KOBAYASHI |
Keyword |
emissivity; high temperature; measurement |
URL |
http://send.nal.go.jp/send/jpn/dlpdf.php3/naltm0000755.pdf?id=NALTM0000755 |
보고서번호 |
NAL TM-755 |
발행년도 |
2000.11 |
출처 |
NAL (National Aerospace Laboratory of Japan) |
ABSTRACT |
In this paper we propose a new technique for the measurement of high temperature emissivity. The method employed here is based on the moving specimen method, and the new technique applied to graphite specimens in several states of surface roughness. We observed that emissivity depends on the roughness of the surface and is influenced by the time constant of the emissivity sensor |