타이틀 |
Correlation Between Analog Noise Measurements and the Expected Bit Error Rate of a Digital Signal Propagating Through Passive Components |
저자 |
Warner, Joseph D.;; Theofylaktos, Onoufrios |
Keyword |
BIT ERROR RATE;; CIRCUITS;; CORRELATION;; DIGITAL ELECTRONICS;; LOGIC CIRCUITS;; NOISE MEASUREMENT;; STANDARD DEVIATION |
URL |
http://hdl.handle.net/2060/20120016799 |
보고서번호 |
NASA/TM-2012-217238 |
발행년도 |
2012 |
출처 |
NTRS (NASA Technical Report Server) |
ABSTRACT |
A method of determining the bit error rate (BER) of a digital circuit from the measurement of the analog S-parameters of the circuit has been developed. The method is based on the measurement of the noise and the standard deviation of the noise in the S-parameters. Once the standard deviation and the mean of the S-parameters are known, the BER of the circuit can be calculated using the normal Gaussian function. |