타이틀 |
Alumina Based 500 C Electronic Packaging Systems and Future Development |
저자 |
Chen, Liang-Yu |
Keyword |
AEROSPACE ENVIRONMENTS;; ALUMINUM OXIDES;; CHIPS (ELECTRONICS); ELECTRONIC PACKAGING;; HIGH TEMPERATURE ENVIRONMENTS;; NASA SPACE PROGRAMS;; OXIDE FILMS;; PRINTED CIRCUITS;; SPACE SHUTTLE MISSIONS;; SYSTEMS ENGINEERING;; THICK FILMS |
URL |
http://hdl.handle.net/2060/20120016721 |
보고서번호 |
ARC-E-DAA-TN6080 |
발행년도 |
2012 |
출처 |
NTRS (NASA Technical Report Server) |
ABSTRACT |
NASA space and aeronautical missions for probing the inner solar planets as well as for in situ monitoring and control of next-generation aeronautical engines require high-temperature environment operable sensors and electronics. A 96% aluminum oxide and Au thick-film metallization based packaging system including chip-level packages, printed circuit board, and edge-connector is in development for high temperature SiC electronics. An electronic packaging system based on this material system was successfully tested and demonstrated with SiC electronics at 500 C for over 10,000 hours in laboratory conditions previously. In addition to the tests in laboratory environments, this packaging system has more recently been tested with a SiC junction field effect transistor (JFET) on low earth orbit through the NASA Materials on the International Space Station Experiment 7 (MISSE7). A SiC JFET with a packaging system composed of a 96% alumina chip-level package and an alumina printed circuit board mounted on a data acquisition circuit board was launched as a part of the MISSE7 suite to International Space Station via a Shuttle mission and tested on the orbit for eighteen months. A summary of results of tests in both laboratory and space environments will be presented. The future development of alumina based high temperature packaging using co-fired material systems for improved performance at high temperature and more feasible mass production will also be discussed. |