국내 최대 기계 및 로봇 연구정보

기술보고서

기술보고서 게시판 내용
타이틀	Advances in LADAR Components and Subsystems at Raytheon
저자	Jack, Michael;; Chapman, George;; Edwards, John;; McKeag, William;; Veeder, Tricia;; Wehner, Justin;; Roberts, Tom;; Robinson, Tom;; Neisz, James;; Andressen, Cliff;; Rinker, Robert;; Hall, Donald N. B.;; Jacobson, Shane M.;; Amzajerdian, Farzin;; Cook, T. Dean
Keyword	AMPLIFICATION;; AVALANCHE DIODES;; BANDWIDTH;; CHIPS;; CHIPS (ELECTRONICS); COMPONENTS;; DETECTION;; IMAGING TECHNIQUES;; LUNAR LANDING;; MERCURY CADMIUM TELLURIDES;; NEAR INFRARED RADIATION;; OPTICAL RADAR;; PHOTODIODES;; PHOTONS;; REAL TIME OPERATION;; RECEIVERS;; SENSITIVITY;; SPATIAL RESOLUTION
URL	http://hdl.handle.net/2060/20120009358
보고서번호	NF1676L-14748
발행년도	2012
출처	NTRS (NASA Technical Report Server)
ABSTRACT	Raytheon is developing NIR sensor chip assemblies (SCAs) for scanning and staring 3D LADAR systems. High sensitivity is obtained by integrating high performance detectors with gain, i.e., APDs with very low noise Readout Integrated Circuits (ROICs). Unique aspects of these designs include: independent acquisition (non-gated) of pulse returns, multiple pulse returns with both time and intensity reported to enable full 3D reconstruction of the image. Recent breakthrough in device design has resulted in HgCdTe APDs operating at 300K with essentially no excess noise to gains in excess of 100, low NEP <1nW and GHz bandwidths and have demonstrated linear mode photon counting. SCAs utilizing these high performance APDs have been integrated and demonstrated excellent spatial and range resolution enabling detailed 3D imagery both at short range and long ranges. In the following we will review progress in real-time 3D LADAR imaging receiver products in three areas: Ƒ) scanning 256 x 4 configuration for the Multi-Mode Sensor Seeker (MMSS) program and ƒ) staring 256 x 256 configuration for the Autonomous Landing and Hazard Avoidance Technology (ALHAT) lunar landing mission and Ɠ) Photon-Counting SCAs which have demonstrated a dramatic reduction in dark count rate due to improved design, operation and processing.