국내 최대 기계 및 로봇 연구정보

기술보고서

기술보고서 게시판 내용
타이틀	A Robust Strategy for Total Ionizing Dose Testing of Field Programmable Gate Arrays
저자	Wilcox, Edward;; Berg, Melanie;; Friendlich, Mark;; Lakeman, Joseph;; KIm, Hak;; Pellish, Jonathan;; LaBel, Kenneth
Keyword	FIELD-PROGRAMMABLE GATE ARRAYS;; FLIP-FLOPS;; ION IRRADIATION;; IONIZATION;; IONIZING RADIATION;; RADIATION DAMAGE;; RADIATION DOSAGE;; RADIATION EFFECTS
URL	http://hdl.handle.net/2060/20120009206
보고서번호	GSFC.ABS.6193.2012
발행년도	2012
출처	NTRS (NASA Technical Report Server)
ABSTRACT	We present a novel method of FPGA TID testing that measures propagation delay between flip-flops operating at maximum speed. Measurement is performed on-chip at-speed and provides a key design metric when building system-critical synchronous designs.