국내 최대 기계 및 로봇 연구정보

기술보고서

기술보고서 게시판 내용
타이틀	Interim Test Status Report for NEPP Scaled CMOS
저자	Bowles-Martinez, Jessica N.;; Guertin, Steven M.
Keyword	CMOS;; DATA ACQUISITION;; ELECTRIC EQUIPMENT TESTS;; ELECTRICAL MEASUREMENT;; ELECTRONIC EQUIPMENT TESTS;; RELIABILITY;; STABILITY TESTS
URL	http://hdl.handle.net/2060/20110008028
보고서번호	JPL-Publ-10-13
발행년도	2010
출처	NTRS (NASA Technical Report Server)
ABSTRACT	This document serves as the fiscal year end report for the NEPP scaled complementary metal-oxide semiconductor (CMOS) task. Much of the effort this year focused on development of test capability and initial collection of data on SDRAM devices. Since the system has only just begun (in the last four weeks) to gather data, this report focuses on the test system and preliminary results.