타이틀 | 2010 PEM Standard Final Report |
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저자 | Cooper, Mark |
Keyword | COMPONENT RELIABILITY;; ENCAPSULATED MICROCIRCUITS;; MICROELECTRONICS;; PLASTIC COATINGS;; PROTECTIVE COATINGS;; QUALIFICATIONS;; RISK ASSESSMENT;; SPECIFICATIONS;; STANDARDS |
URL | http://hdl.handle.net/2060/20100042163 |
보고서번호 | JPL-Publ-10-10 |
발행년도 | 2010 |
출처 | NTRS (NASA Technical Report Server) |
ABSTRACT | Criteria are developed for screening and qualification for Space projects of Plastic Encapsulated Microelectronics (PEM). |