국내 최대 기계 및 로봇 연구정보

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타이틀	Commercial Sensor Survey Fiscal Year 2010 Radiation Test Report
저자	Becker, Heidi N.;; Thorborn, Dennis O.;; Alexander, James W.;; Eisenman, Allan R.
Keyword	CAMERAS;; EDUCATION;; ELECTRONIC PACKAGING;; IMAGING TECHNIQUES;; LOW COST;; LUNAR SURFACE;; NASA SPACE PROGRAMS;; PLANETARY SURFACES;; SURVEYS;; SYSTEMS-ON-A-CHIP;; TOLERANCES (MECHANICS)
URL	http://hdl.handle.net/2060/20100040684
보고서번호	JPL-Publ-10-7
발행년도	2010
출처	NTRS (NASA Technical Report Server)
ABSTRACT	The NASA Electronic Parts and Packaging (NEPP) Program Sensor Technology Commercial Sensor Survey task is geared toward benefiting future NASA space missions with low-cost, short-duty-cycle, visible-wavelength imaging needs. Such applications could include imaging for educational outreach purposes or short surveys of spacecraft, planetary, or lunar surfaces. Under the task, inexpensive, low-power, commercial grade CMOS sensors were surveyed in fiscal year 2007, and three sensors were selected and tested for total ionizing dose (TID) and displacement damage dose (DDD) tolerance in fiscal year 2008 (FY08). The selected sensors had to meet selection criteria chosen to support small, low-mass cameras that produce good resolution color images. The commercial CMOS sensors tested under the task in FY08 showed very promising response to TID and DDD levels typical of outreach and survey camera applications. In fiscal year 2009 (FY09), the survey was broadened to include two additional, similar sensor products. This document presents results for an additional commercial CMOS sensor tested in FY10, the Aptina (formerly Micron) MT9D131 CMOS Camera System-on-a-Chip.