국내 최대 기계 및 로봇 연구정보

기술보고서

기술보고서 게시판 내용
타이틀	Evaluation of an Accelerated ELDRS Test Using Molecular Hydrogen
저자	Adell, Philippe;; Rax, Bernard;; McClure, Steve;; Barnaby, Hugh;; Pease, Ron
Keyword	ACCELERATED LIFE TESTS;; BIPOLARITY;; DOSAGE;; HARDNESS TESTS;; HYDROGEN;; LINEAR CIRCUITS;; MOLECULAR GASES;; SENSITIVITY
URL	http://hdl.handle.net/2060/20100040691
보고서번호	JPL-Publ-10-17
발행년도	2010
출처	NTRS (NASA Technical Report Server)
ABSTRACT	An accelerated total ionizing dose (TID) hardness assurance test for enhanced-low-dose-rate-sensitive (ELDRS) bipolar linear circuits, using high-dose-rate tests on parts that have been exposed to molecular hydrogen, has been proposed and demonstrated on several ELDRS part types. In this study, several radiation-hardened "ELDRS-free" part types have been tested using this same approach to see if the test is overly conservative. Radiation hardness assurance implications are discussed.